上海科斯泰克設備銷售有限公司
網站標題

清空記錄

曆史記錄

清空記錄

曆史記錄

取消

清空記錄

曆史記錄

上海科斯泰克設備銷售有限公司
    當前位置:
  • 首頁>
  • 產品中心>
  • 半導體輔助設備>
  • 量子效率(個性化PTS模型)

產品中心

量子效率(個性化PTS模型)
分享

分享到微信

×
PTS係(xi)列(lie)量(liang)子(zi)效(xiao)率(lv)測(ce)試(shi)係(xi)統(tong)是(shi)一(yi)款(kuan)高(gao)度(du)可(ke)定(ding)製(zhi)的(de)光(guang)伏(fu)表(biao)征(zheng)平(ping)台(tai),提(ti)供(gong)從(cong)標(biao)準(zhun)光(guang)譜(pu)響(xiang)應(ying)到(dao)擴(kuo)展(zhan)紅(hong)外(wai)測(ce)量(liang)的(de)完(wan)整(zheng)解(jie)決(jue)方(fang)案(an)。係(xi)統(tong)集(ji)成(cheng)可(ke)調(tiao)單(dan)色(se)光(guang)源(yuan)、AAA級穩態太陽模擬器、高精度測量電子學及SciPV專業軟件,實現光譜響應(SR)、外部量子效率(EQE/IPCE)、內部量子效率(IQE)及電流-電壓(IV)的整體測量。產品嚴格遵循ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1等國際標準,並符合CE認證要求。PTS係列提供PTS-S(標準光譜)和PTS-X(擴展光譜)兩種基礎配置,並支持IQE測量、電動XY載物台、多源表等個性化選件,滿足從常規矽電池到寬禁帶/窄禁帶半導體、多結電池、光電探測器等多樣化研究需求。

產品詳情

量子效率(個性化PTS模型)

測試標準:符合CE標準。符合性:適用於根據ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1進行測量

試驗目的:Sciencetech PTS統使用用戶友好的軟件進行SR、EQE、IQEIV測量。該係統包括一個主氙弧燈、一個帶有自動順序分類濾光片的單色儀,以及一個穩態太陽能模擬器AAA級偏置光源、測量電子設備、

計(ji)算(suan)機(ji)和(he)測(ce)量(liang)太(tai)陽(yang)能(neng)電(dian)池(chi)特(te)性(xing)所(suo)需(xu)的(de)軟(ruan)件(jian)選(xuan)項(xiang)。該(gai)係(xi)統(tong)為(wei)用(yong)戶(hu)提(ti)供(gong)了(le)一(yi)個(ge)不(bu)透(tou)光(guang)的(de)樣(yang)品(pin)室(shi),用(yong)於(yu)所(suo)有(you)測(ce)量(liang)。屏(ping)蔽(bi)和(he)不(bu)透(tou)光(guang)的(de)測(ce)試(shi)區(qu)域(yu)外(wai)殼(ke)具(ju)有(you)方(fang)便(bian)的(de)可(ke)拆(chai)卸(xie)蓋(gai)子(zi),允(yun)許(xu)從(cong)頂(ding)部(bu)、正麵和側麵進入。

應用:光伏太陽能電池測試、IV表征、光譜響應、外部量子效率IPCE、內部量子效率(IQE附加)、光電導率測量、反射率和躍遷測量能力

特點:光譜範圍,250-2500nm300-5000nm,多源測量單元選項,鎖定放大器,不透光樣品室,標準或擴展,用戶可選偏壓,交流和直流測量模式,SciPV軟件用於完全控製係統和手動控製快門,電動XY載物台,可選。


Measurement Capabilities

PTS –S (175-9201)

PTS –X (175-9202)

Current-Voltage (IV) Testing

Measures VOC , ISC, Rshunt,   Pmax, efficiency %, and fill factor

Included

Included

Spectral Response (SR)*

Scanning range

250 - 2500 nm

300-5000 nm

External Quantum Efficiency (EQE)

Incident photon to converted electron ratio (IPCE)

Included

Included

AC and DC measurement mode

Modulated / Continuous measurement capability

Included

Included

Internal Quantum Efficiency (IQE)

The ratio of charge carriers collected by the cell   to the number of photons absorbed by the cell

Available as an add-on

Available as an add-on


技術規格

Configuration Description

PTS-S                                                                              (175-9201)

PTS-X                        (175-9202)

Tunable  

Light   Source

150 W  Xenon short arc lamp

(1200 hour lifetime) and   /or 250W QTH lamp

Xe short arc lamp

Xe +QTH lamp

· Tuning/scanning range

250 - 2500 nm

300 - 5000 nm

·  1/4 m Czerny-Turner monochromator

with

an adjustable bandpass and   motorized

triple grating turret   system (3 gratings):

0.2-24 nm with 1200   l/mm  grating  @250 nm

 

0.2-24 nm with 1200   l/mm  blaze @500 nm

 

0.4 - 48 nm with 600 l/mm   @1000 nm

0.4 to 48 nm with 600 l/mm   blaze @ 500 nm

 

0.8 - 96 nm with  300l/mm blaze @ 2000 nm

 

1.6 - 192 nm with 150l/mm   blazed @ 5400 nm

· Adjustable beam size

0.5mm - 2.4 mm diameter   minimum with standard optics

· Hard coated order sorting filters

Included

Included

Bias

Light   Source

· 150 W or 300W Xenon short arc lamp

average lifetime 1200 hours  

Optional, 150W with   Standard Sample Chamber, 300W with Extended Sample Chamber

· 25x25 or 50x50 mm   AAA, (ASTM E927-19) Solar Simulator

· Includes mounted AM1.5G

filter + additional filter   slot

Reference      Detector

· Broadband pyroelectric detector,

Element diameter: 5 mm

Included

Included

· Calibrated range

250 - 2500 nm

300-5000 nm

IQE   Measurement System 

· 50 mm integrating sphere

Optional, available as an   add-on

· Internal quantum efficiency

measurement determined from  

material reflectance   measurement

(hardware included) 250 -   2500nm range.

Measurement   System

· Source meter

Optional

Optional

· Measurement time period for 100 IV

points is 17s

Included

· Voltage bias user settable

±10 V capability

Included

· Lock-in Amplifier

Included

· Chopper 4 - 200 Hz

Included

· Standard auto time constant feature

Included

· Temperature control (10-60 °C)  *

Accessory Available

· AC and DC measurement mode

Included

Sample   Placement

· 50 × 50 mm    simple sample spacer

.for proper placement of   the sample

under the monochromatic and   bias

light beam. Includes simple  

electrical connections.

A simple sample spacer is included, and various cell chucks are   available as add-ons

Software  

and   Interface

· Modern software written in .NET

(Windows 11 Operating   System)

Included

Included

· Compatible with Windows

10/11, 32/64bit

Included

Included

· Data files and automation

log exportable as ASCII

Included

Included

· Pre-configured and tested control

computer included

Included

Included

· Built in microcontroller switches

and monitors signals   automatically

Included

Included

· 1 USB port

Included

Included

· 1 IEC 60320 C14 power entry inlet

Included

Included

Compliance

Intended for use in   measurements

according to ASTM E   1021-15,

ASTM E948, IEC 60904-8, IEC   60904-1

Included

Included

Power   system

· Single phase, configurable for 230 VAC,

50 Hz or 110 VAC, 60 Hz

Included

Included

型號配

型號描述光譜範圍適用場景
PTS-S (175-9201)標準光譜量子效率係統250 - 2500 nm矽、鈣鈦礦、CIGS、有機光伏
PTS-X (175-9202)擴展光譜量子效率係統300 - 5000 nm窄禁帶半導體、紅外探測器、多結電池

測量能力

測量功能PTS-SPTS-X
電流-電壓 (IV) 測試
VOC、ISC、Rshunt、Pmax、效率%、填充因子
包含 包含
光譜響應 (SR) 250-2500 nm 300-5000 nm
外部量子效率 (EQE/IPCE) 包含 包含
AC/DC雙測量模式 包含 包含
內部量子效率 (IQE)可選配件可選配件

詳細技術規格

可調光源係統

參數PTS-SPTS-X
光源類型150W 氙氣短弧燈(可選加配250W QTH)氙氣短弧燈 + QTH燈組合
調諧/掃描範圍250 - 2500 nm300 - 5000 nm
單色儀1/4米 Czerny-Turner,電動三光柵塔輪1/4米 Czerny-Turner,電動三光柵塔輪
光柵配置• 1200 l/mm 閃耀250 nm (0.2-24 nm)
• 1200 l/mm 閃耀500 nm (0.2-24 nm)
• 600 l/mm 閃耀1000 nm (0.4-48 nm)
• 600 l/mm 閃耀500 nm (0.4-48 nm)
• 300 l/mm 閃耀2000 nm (0.8-96 nm)
• 150 l/mm 閃耀5400 nm (1.6-192 nm)
光斑尺寸0.5 - 2.4 mm直徑(標準光學配置)0.5 - 2.4 mm直徑(標準光學配置)
級次分離濾光片硬塗層,包含硬塗層,包含

偏置光源係統

參數PTS-SPTS-X
光源類型150W 氙氣短弧燈(可選300W)150W 氙氣短弧燈(可選300W)
太陽模擬器等級AAA級 (ASTM E927-19),25×25mmAAA級 (ASTM E927-19),50×50mm(擴展樣品室)
濾光片標配AM1.5G + 附加濾光片插槽標配AM1.5G + 附加濾光片插槽

參考探測器

參數PTS-SPTS-X
類型寬波段熱釋電探測器,5 mm直徑寬波段熱釋電探測器,5 mm直徑
校準範圍250 - 2500 nm300 - 5000 nm
IQE測量係統(可選配件)
參數規格
積分球50 mm直徑
測量原理通過反射率測量計算本征量子效率
光譜範圍PTS-S:250-2500 nm / PTS-X:300-5000 nm
測量係統
參數PTS-SPTS-X
源表可選配件可選配件
100點IV測量時間17秒17秒
電壓偏置±10 V可調±10 V可調
鎖相放大器 包含 包含
斬波器4 - 200 Hz4 - 200 Hz
自動時間常數 包含 包含
溫度控製可選配件 (10-60°C)可選配件 (10-60°C)
測量模式AC/DC雙模式AC/DC雙模式
樣品放置
參數PTS-SPTS-X
樣品台50×50 mm簡易樣品定位器簡易樣品定位器(多種樣品夾具可選)
電動XY載物台可選配件可選配件
軟件與接口
參數規格
軟件SciPV,.NET架構,Windows 11兼容
操作係統Windows 10/11 (32/64位)
數據導出ASCII格式
控製電腦預裝測試軟件,即插即用
接口1×USB,1×IEC 60320 C14電源入口
自動控製內置微控製器,自動切換與監控
合規與電源
參數規格
符合標準ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1
認證CE
電源單相,可配置230VAC 50Hz / 110VAC 60Hz
個性化定製選項
選項說明
IQE測量套件50 mm積分球,實現內部量子效率測量
電動XY載物台自動掃描,多點測量, mapping功能
多源表滿足大電流/高電壓特殊需求
溫度控製10 - 60℃可調,研究溫度依賴性
擴展樣品室更大空間,適配特殊封裝器件
多種樣品夾具針對不同電極結構定製
QTH附加光源PTS-S可選,增強近紅外輸出
300W偏置光源更高光強,適用於大麵積電池

PTS係列量子效率測試係統以雙光譜範圍可選、IQE靈活擴展、高精度測量、全自動軟件、個性化定製為主要優勢,為光伏、光電材料與器件研究提供完整的量子效率表征解決方案。無論您研究的是常規矽電池,還是

前沿的窄禁帶材料,PTS係列都能滿足您的測量需求。

量子效率(個性化PTS模型)

量子效率(個性化PTS模型)

分享

分享到微信

×
PTS係(xi)列(lie)量(liang)子(zi)效(xiao)率(lv)測(ce)試(shi)係(xi)統(tong)是(shi)一(yi)款(kuan)高(gao)度(du)可(ke)定(ding)製(zhi)的(de)光(guang)伏(fu)表(biao)征(zheng)平(ping)台(tai),提(ti)供(gong)從(cong)標(biao)準(zhun)光(guang)譜(pu)響(xiang)應(ying)到(dao)擴(kuo)展(zhan)紅(hong)外(wai)測(ce)量(liang)的(de)完(wan)整(zheng)解(jie)決(jue)方(fang)案(an)。係(xi)統(tong)集(ji)成(cheng)可(ke)調(tiao)單(dan)色(se)光(guang)源(yuan)、AAA級穩態太陽模擬器、高精度測量電子學及SciPV專業軟件,實現光譜響應(SR)、外部量子效率(EQE/IPCE)、內部量子效率(IQE)及電流-電壓(IV)的整體測量。產品嚴格遵循ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1等國際標準,並符合CE認證要求。PTS係列提供PTS-S(標準光譜)和PTS-X(擴展光譜)兩種基礎配置,並支持IQE測量、電動XY載物台、多源表等個性化選件,滿足從常規矽電池到寬禁帶/窄禁帶半導體、多結電池、光電探測器等多樣化研究需求。

產品詳情

量子效率(個性化PTS模型)

測試標準:符合CE標準。符合性:適用於根據ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1進行測量

試驗目的:Sciencetech PTS統使用用戶友好的軟件進行SR、EQE、IQEIV測量。該係統包括一個主氙弧燈、一個帶有自動順序分類濾光片的單色儀,以及一個穩態太陽能模擬器AAA級偏置光源、測量電子設備、

計(ji)算(suan)機(ji)和(he)測(ce)量(liang)太(tai)陽(yang)能(neng)電(dian)池(chi)特(te)性(xing)所(suo)需(xu)的(de)軟(ruan)件(jian)選(xuan)項(xiang)。該(gai)係(xi)統(tong)為(wei)用(yong)戶(hu)提(ti)供(gong)了(le)一(yi)個(ge)不(bu)透(tou)光(guang)的(de)樣(yang)品(pin)室(shi),用(yong)於(yu)所(suo)有(you)測(ce)量(liang)。屏(ping)蔽(bi)和(he)不(bu)透(tou)光(guang)的(de)測(ce)試(shi)區(qu)域(yu)外(wai)殼(ke)具(ju)有(you)方(fang)便(bian)的(de)可(ke)拆(chai)卸(xie)蓋(gai)子(zi),允(yun)許(xu)從(cong)頂(ding)部(bu)、正麵和側麵進入。

應用:光伏太陽能電池測試、IV表征、光譜響應、外部量子效率IPCE、內部量子效率(IQE附加)、光電導率測量、反射率和躍遷測量能力

特點:光譜範圍,250-2500nm300-5000nm,多源測量單元選項,鎖定放大器,不透光樣品室,標準或擴展,用戶可選偏壓,交流和直流測量模式,SciPV軟件用於完全控製係統和手動控製快門,電動XY載物台,可選。


Measurement Capabilities

PTS –S (175-9201)

PTS –X (175-9202)

Current-Voltage (IV) Testing

Measures VOC , ISC, Rshunt,   Pmax, efficiency %, and fill factor

Included

Included

Spectral Response (SR)*

Scanning range

250 - 2500 nm

300-5000 nm

External Quantum Efficiency (EQE)

Incident photon to converted electron ratio (IPCE)

Included

Included

AC and DC measurement mode

Modulated / Continuous measurement capability

Included

Included

Internal Quantum Efficiency (IQE)

The ratio of charge carriers collected by the cell   to the number of photons absorbed by the cell

Available as an add-on

Available as an add-on


技術規格

Configuration Description

PTS-S                                                                              (175-9201)

PTS-X                        (175-9202)

Tunable  

Light   Source

150 W  Xenon short arc lamp

(1200 hour lifetime) and   /or 250W QTH lamp

Xe short arc lamp

Xe +QTH lamp

· Tuning/scanning range

250 - 2500 nm

300 - 5000 nm

·  1/4 m Czerny-Turner monochromator

with

an adjustable bandpass and   motorized

triple grating turret   system (3 gratings):

0.2-24 nm with 1200   l/mm  grating  @250 nm

 

0.2-24 nm with 1200   l/mm  blaze @500 nm

 

0.4 - 48 nm with 600 l/mm   @1000 nm

0.4 to 48 nm with 600 l/mm   blaze @ 500 nm

 

0.8 - 96 nm with  300l/mm blaze @ 2000 nm

 

1.6 - 192 nm with 150l/mm   blazed @ 5400 nm

· Adjustable beam size

0.5mm - 2.4 mm diameter   minimum with standard optics

· Hard coated order sorting filters

Included

Included

Bias

Light   Source

· 150 W or 300W Xenon short arc lamp

average lifetime 1200 hours  

Optional, 150W with   Standard Sample Chamber, 300W with Extended Sample Chamber

· 25x25 or 50x50 mm   AAA, (ASTM E927-19) Solar Simulator

· Includes mounted AM1.5G

filter + additional filter   slot

Reference      Detector

· Broadband pyroelectric detector,

Element diameter: 5 mm

Included

Included

· Calibrated range

250 - 2500 nm

300-5000 nm

IQE   Measurement System 

· 50 mm integrating sphere

Optional, available as an   add-on

· Internal quantum efficiency

measurement determined from  

material reflectance   measurement

(hardware included) 250 -   2500nm range.

Measurement   System

· Source meter

Optional

Optional

· Measurement time period for 100 IV

points is 17s

Included

· Voltage bias user settable

±10 V capability

Included

· Lock-in Amplifier

Included

· Chopper 4 - 200 Hz

Included

· Standard auto time constant feature

Included

· Temperature control (10-60 °C)  *

Accessory Available

· AC and DC measurement mode

Included

Sample   Placement

· 50 × 50 mm    simple sample spacer

.for proper placement of   the sample

under the monochromatic and   bias

light beam. Includes simple  

electrical connections.

A simple sample spacer is included, and various cell chucks are   available as add-ons

Software  

and   Interface

· Modern software written in .NET

(Windows 11 Operating   System)

Included

Included

· Compatible with Windows

10/11, 32/64bit

Included

Included

· Data files and automation

log exportable as ASCII

Included

Included

· Pre-configured and tested control

computer included

Included

Included

· Built in microcontroller switches

and monitors signals   automatically

Included

Included

· 1 USB port

Included

Included

· 1 IEC 60320 C14 power entry inlet

Included

Included

Compliance

Intended for use in   measurements

according to ASTM E   1021-15,

ASTM E948, IEC 60904-8, IEC   60904-1

Included

Included

Power   system

· Single phase, configurable for 230 VAC,

50 Hz or 110 VAC, 60 Hz

Included

Included

型號配

型號描述光譜範圍適用場景
PTS-S (175-9201)標準光譜量子效率係統250 - 2500 nm矽、鈣鈦礦、CIGS、有機光伏
PTS-X (175-9202)擴展光譜量子效率係統300 - 5000 nm窄禁帶半導體、紅外探測器、多結電池

測量能力

測量功能PTS-SPTS-X
電流-電壓 (IV) 測試
VOC、ISC、Rshunt、Pmax、效率%、填充因子
包含 包含
光譜響應 (SR) 250-2500 nm 300-5000 nm
外部量子效率 (EQE/IPCE) 包含 包含
AC/DC雙測量模式 包含 包含
內部量子效率 (IQE)可選配件可選配件

詳細技術規格

可調光源係統

參數PTS-SPTS-X
光源類型150W 氙氣短弧燈(可選加配250W QTH)氙氣短弧燈 + QTH燈組合
調諧/掃描範圍250 - 2500 nm300 - 5000 nm
單色儀1/4米 Czerny-Turner,電動三光柵塔輪1/4米 Czerny-Turner,電動三光柵塔輪
光柵配置• 1200 l/mm 閃耀250 nm (0.2-24 nm)
• 1200 l/mm 閃耀500 nm (0.2-24 nm)
• 600 l/mm 閃耀1000 nm (0.4-48 nm)
• 600 l/mm 閃耀500 nm (0.4-48 nm)
• 300 l/mm 閃耀2000 nm (0.8-96 nm)
• 150 l/mm 閃耀5400 nm (1.6-192 nm)
光斑尺寸0.5 - 2.4 mm直徑(標準光學配置)0.5 - 2.4 mm直徑(標準光學配置)
級次分離濾光片硬塗層,包含硬塗層,包含

偏置光源係統

參數PTS-SPTS-X
光源類型150W 氙氣短弧燈(可選300W)150W 氙氣短弧燈(可選300W)
太陽模擬器等級AAA級 (ASTM E927-19),25×25mmAAA級 (ASTM E927-19),50×50mm(擴展樣品室)
濾光片標配AM1.5G + 附加濾光片插槽標配AM1.5G + 附加濾光片插槽

參考探測器

參數PTS-SPTS-X
類型寬波段熱釋電探測器,5 mm直徑寬波段熱釋電探測器,5 mm直徑
校準範圍250 - 2500 nm300 - 5000 nm
IQE測量係統(可選配件)
參數規格
積分球50 mm直徑
測量原理通過反射率測量計算本征量子效率
光譜範圍PTS-S:250-2500 nm / PTS-X:300-5000 nm
測量係統
參數PTS-SPTS-X
源表可選配件可選配件
100點IV測量時間17秒17秒
電壓偏置±10 V可調±10 V可調
鎖相放大器 包含 包含
斬波器4 - 200 Hz4 - 200 Hz
自動時間常數 包含 包含
溫度控製可選配件 (10-60°C)可選配件 (10-60°C)
測量模式AC/DC雙模式AC/DC雙模式
樣品放置
參數PTS-SPTS-X
樣品台50×50 mm簡易樣品定位器簡易樣品定位器(多種樣品夾具可選)
電動XY載物台可選配件可選配件
軟件與接口
參數規格
軟件SciPV,.NET架構,Windows 11兼容
操作係統Windows 10/11 (32/64位)
數據導出ASCII格式
控製電腦預裝測試軟件,即插即用
接口1×USB,1×IEC 60320 C14電源入口
自動控製內置微控製器,自動切換與監控
合規與電源
參數規格
符合標準ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1
認證CE
電源單相,可配置230VAC 50Hz / 110VAC 60Hz
個性化定製選項
選項說明
IQE測量套件50 mm積分球,實現內部量子效率測量
電動XY載物台自動掃描,多點測量, mapping功能
多源表滿足大電流/高電壓特殊需求
溫度控製10 - 60℃可調,研究溫度依賴性
擴展樣品室更大空間,適配特殊封裝器件
多種樣品夾具針對不同電極結構定製
QTH附加光源PTS-S可選,增強近紅外輸出
300W偏置光源更高光強,適用於大麵積電池

PTS係列量子效率測試係統以雙光譜範圍可選、IQE靈活擴展、高精度測量、全自動軟件、個性化定製為主要優勢,為光伏、光電材料與器件研究提供完整的量子效率表征解決方案。無論您研究的是常規矽電池,還是

前沿的窄禁帶材料,PTS係列都能滿足您的測量需求。

詢價表單

選擇區號