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量子效率(個性化PTS模型)
測試標準:符合CE標準。符合性:適用於根據ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1進行測量
試驗目的:Sciencetech PTS係統使用用戶友好的軟件進行SR、EQE、IQE和IV測量。該係統包括一個主氙弧燈、一個帶有自動順序分類濾光片的單色儀,以及一個穩態太陽能模擬器AAA級偏置光源、測量電子設備、
計(ji)算(suan)機(ji)和(he)測(ce)量(liang)太(tai)陽(yang)能(neng)電(dian)池(chi)特(te)性(xing)所(suo)需(xu)的(de)軟(ruan)件(jian)選(xuan)項(xiang)。該(gai)係(xi)統(tong)為(wei)用(yong)戶(hu)提(ti)供(gong)了(le)一(yi)個(ge)不(bu)透(tou)光(guang)的(de)樣(yang)品(pin)室(shi),用(yong)於(yu)所(suo)有(you)測(ce)量(liang)。屏(ping)蔽(bi)和(he)不(bu)透(tou)光(guang)的(de)測(ce)試(shi)區(qu)域(yu)外(wai)殼(ke)具(ju)有(you)方(fang)便(bian)的(de)可(ke)拆(chai)卸(xie)蓋(gai)子(zi),允(yun)許(xu)從(cong)頂(ding)部(bu)、正麵和側麵進入。
應用:光伏太陽能電池測試、IV表征、光譜響應、外部量子效率IPCE、內部量子效率(IQE附加)、光電導率測量、反射率和躍遷測量能力
特點:光譜範圍,250-2500nm或300-5000nm,多源測量單元選項,鎖定放大器,不透光樣品室,標準或擴展,用戶可選偏壓,交流和直流測量模式,SciPV軟件用於完全控製係統和手動控製快門,電動XY載物台,可選。
Measurement Capabilities | PTS –S (175-9201) | PTS –X (175-9202) | |
Current-Voltage (IV) Testing | Measures VOC , ISC, Rshunt, Pmax, efficiency %, and fill factor | Included | Included |
Spectral Response (SR)* | Scanning range | 250 - 2500 nm | 300-5000 nm |
External Quantum Efficiency (EQE) | Incident photon to converted electron ratio (IPCE) | Included | Included |
AC and DC measurement mode | Modulated / Continuous measurement capability | Included | Included |
Internal Quantum Efficiency (IQE) | The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell | Available as an add-on | Available as an add-on |
技術規格
Configuration Description | PTS-S (175-9201) | PTS-X (175-9202) | |
Tunable Light Source | 150 W Xenon short arc lamp (1200 hour lifetime) and /or 250W QTH lamp | Xe short arc lamp | Xe +QTH lamp |
· Tuning/scanning range | 250 - 2500 nm | 300 - 5000 nm | |
· 1/4 m Czerny-Turner monochromator with an adjustable bandpass and motorized triple grating turret system (3 gratings): | 0.2-24 nm with 1200 l/mm grating @250 nm
0.2-24 nm with 1200 l/mm blaze @500 nm
0.4 - 48 nm with 600 l/mm @1000 nm | 0.4 to 48 nm with 600 l/mm blaze @ 500 nm
0.8 - 96 nm with 300l/mm blaze @ 2000 nm
1.6 - 192 nm with 150l/mm blazed @ 5400 nm | |
· Adjustable beam size | 0.5mm - 2.4 mm diameter minimum with standard optics | ||
· Hard coated order sorting filters | Included | Included | |
Bias Light Source | · 150 W or 300W Xenon short arc lamp average lifetime 1200 hours | Optional, 150W with Standard Sample Chamber, 300W with Extended Sample Chamber | |
· 25x25 or 50x50 mm AAA, (ASTM E927-19) Solar Simulator | |||
· Includes mounted AM1.5G filter + additional filter slot | |||
Reference Detector | · Broadband pyroelectric detector, Element diameter: 5 mm | Included | Included |
· Calibrated range | 250 - 2500 nm | 300-5000 nm | |
IQE Measurement System | · 50 mm integrating sphere | Optional, available as an add-on | |
· Internal quantum efficiency measurement determined from material reflectance measurement (hardware included) 250 - 2500nm range. | |||
Measurement System | · Source meter | Optional | Optional |
· Measurement time period for 100 IV points is 17s | Included | ||
· Voltage bias user settable ±10 V capability | Included | ||
· Lock-in Amplifier | Included | ||
· Chopper 4 - 200 Hz | Included | ||
· Standard auto time constant feature | Included | ||
· Temperature control (10-60 °C) * | Accessory Available | ||
· AC and DC measurement mode | Included | ||
Sample Placement | · 50 × 50 mm simple sample spacer .for proper placement of the sample under the monochromatic and bias light beam. Includes simple electrical connections. | A simple sample spacer is included, and various cell chucks are available as add-ons | |
Software and Interface | · Modern software written in .NET (Windows 11 Operating System) | Included | Included |
· Compatible with Windows 10/11, 32/64bit | Included | Included | |
· Data files and automation log exportable as ASCII | Included | Included | |
· Pre-configured and tested control computer included | Included | Included | |
· Built in microcontroller switches and monitors signals automatically | Included | Included | |
· 1 USB port | Included | Included | |
· 1 IEC 60320 C14 power entry inlet | Included | Included | |
Compliance | Intended for use in measurements according to ASTM E 1021-15, ASTM E948, IEC 60904-8, IEC 60904-1 | Included | Included |
Power system | · Single phase, configurable for 230 VAC, 50 Hz or 110 VAC, 60 Hz | Included | Included |
型號配置
| 型號 | 描述 | 光譜範圍 | 適用場景 |
|---|---|---|---|
| PTS-S (175-9201) | 標準光譜量子效率係統 | 250 - 2500 nm | 矽、鈣鈦礦、CIGS、有機光伏 |
| PTS-X (175-9202) | 擴展光譜量子效率係統 | 300 - 5000 nm | 窄禁帶半導體、紅外探測器、多結電池 |
測量能力
| 測量功能 | PTS-S | PTS-X |
|---|---|---|
| 電流-電壓 (IV) 測試 VOC、ISC、Rshunt、Pmax、效率%、填充因子 | 包含 | 包含 |
| 光譜響應 (SR) | 250-2500 nm | 300-5000 nm |
| 外部量子效率 (EQE/IPCE) | 包含 | 包含 |
| AC/DC雙測量模式 | 包含 | 包含 |
| 內部量子效率 (IQE) | 可選配件 | 可選配件 |
詳細技術規格
可調光源係統
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 光源類型 | 150W 氙氣短弧燈(可選加配250W QTH) | 氙氣短弧燈 + QTH燈組合 |
| 調諧/掃描範圍 | 250 - 2500 nm | 300 - 5000 nm |
| 單色儀 | 1/4米 Czerny-Turner,電動三光柵塔輪 | 1/4米 Czerny-Turner,電動三光柵塔輪 |
| 光柵配置 | • 1200 l/mm 閃耀250 nm (0.2-24 nm) • 1200 l/mm 閃耀500 nm (0.2-24 nm) • 600 l/mm 閃耀1000 nm (0.4-48 nm) | • 600 l/mm 閃耀500 nm (0.4-48 nm) • 300 l/mm 閃耀2000 nm (0.8-96 nm) • 150 l/mm 閃耀5400 nm (1.6-192 nm) |
| 光斑尺寸 | 0.5 - 2.4 mm直徑(標準光學配置) | 0.5 - 2.4 mm直徑(標準光學配置) |
| 級次分離濾光片 | 硬塗層,包含 | 硬塗層,包含 |
偏置光源係統
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 光源類型 | 150W 氙氣短弧燈(可選300W) | 150W 氙氣短弧燈(可選300W) |
| 太陽模擬器等級 | AAA級 (ASTM E927-19),25×25mm | AAA級 (ASTM E927-19),50×50mm(擴展樣品室) |
| 濾光片 | 標配AM1.5G + 附加濾光片插槽 | 標配AM1.5G + 附加濾光片插槽 |
參考探測器
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 類型 | 寬波段熱釋電探測器,5 mm直徑 | 寬波段熱釋電探測器,5 mm直徑 |
| 校準範圍 | 250 - 2500 nm | 300 - 5000 nm |
| 參數 | 規格 |
|---|---|
| 積分球 | 50 mm直徑 |
| 測量原理 | 通過反射率測量計算本征量子效率 |
| 光譜範圍 | PTS-S:250-2500 nm / PTS-X:300-5000 nm |
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 源表 | 可選配件 | 可選配件 |
| 100點IV測量時間 | 17秒 | 17秒 |
| 電壓偏置 | ±10 V可調 | ±10 V可調 |
| 鎖相放大器 | 包含 | 包含 |
| 斬波器 | 4 - 200 Hz | 4 - 200 Hz |
| 自動時間常數 | 包含 | 包含 |
| 溫度控製 | 可選配件 (10-60°C) | 可選配件 (10-60°C) |
| 測量模式 | AC/DC雙模式 | AC/DC雙模式 |
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 樣品台 | 50×50 mm簡易樣品定位器 | 簡易樣品定位器(多種樣品夾具可選) |
| 電動XY載物台 | 可選配件 | 可選配件 |
| 參數 | 規格 |
|---|---|
| 軟件 | SciPV,.NET架構,Windows 11兼容 |
| 操作係統 | Windows 10/11 (32/64位) |
| 數據導出 | ASCII格式 |
| 控製電腦 | 預裝測試軟件,即插即用 |
| 接口 | 1×USB,1×IEC 60320 C14電源入口 |
| 自動控製 | 內置微控製器,自動切換與監控 |
| 參數 | 規格 |
|---|---|
| 符合標準 | ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1 |
| 認證 | CE |
| 電源 | 單相,可配置230VAC 50Hz / 110VAC 60Hz |
| 選項 | 說明 |
|---|---|
| IQE測量套件 | 50 mm積分球,實現內部量子效率測量 |
| 電動XY載物台 | 自動掃描,多點測量, mapping功能 |
| 多源表 | 滿足大電流/高電壓特殊需求 |
| 溫度控製 | 10 - 60℃可調,研究溫度依賴性 |
| 擴展樣品室 | 更大空間,適配特殊封裝器件 |
| 多種樣品夾具 | 針對不同電極結構定製 |
| QTH附加光源 | PTS-S可選,增強近紅外輸出 |
| 300W偏置光源 | 更高光強,適用於大麵積電池 |
PTS係列量子效率測試係統以雙光譜範圍可選、IQE靈活擴展、高精度測量、全自動軟件、個性化定製為主要優勢,為光伏、光電材料與器件研究提供完整的量子效率表征解決方案。無論您研究的是常規矽電池,還是
前沿的窄禁帶材料,PTS係列都能滿足您的測量需求。
量子效率(個性化PTS模型)
測試標準:符合CE標準。符合性:適用於根據ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1進行測量
試驗目的:Sciencetech PTS係統使用用戶友好的軟件進行SR、EQE、IQE和IV測量。該係統包括一個主氙弧燈、一個帶有自動順序分類濾光片的單色儀,以及一個穩態太陽能模擬器AAA級偏置光源、測量電子設備、
計(ji)算(suan)機(ji)和(he)測(ce)量(liang)太(tai)陽(yang)能(neng)電(dian)池(chi)特(te)性(xing)所(suo)需(xu)的(de)軟(ruan)件(jian)選(xuan)項(xiang)。該(gai)係(xi)統(tong)為(wei)用(yong)戶(hu)提(ti)供(gong)了(le)一(yi)個(ge)不(bu)透(tou)光(guang)的(de)樣(yang)品(pin)室(shi),用(yong)於(yu)所(suo)有(you)測(ce)量(liang)。屏(ping)蔽(bi)和(he)不(bu)透(tou)光(guang)的(de)測(ce)試(shi)區(qu)域(yu)外(wai)殼(ke)具(ju)有(you)方(fang)便(bian)的(de)可(ke)拆(chai)卸(xie)蓋(gai)子(zi),允(yun)許(xu)從(cong)頂(ding)部(bu)、正麵和側麵進入。
應用:光伏太陽能電池測試、IV表征、光譜響應、外部量子效率IPCE、內部量子效率(IQE附加)、光電導率測量、反射率和躍遷測量能力
特點:光譜範圍,250-2500nm或300-5000nm,多源測量單元選項,鎖定放大器,不透光樣品室,標準或擴展,用戶可選偏壓,交流和直流測量模式,SciPV軟件用於完全控製係統和手動控製快門,電動XY載物台,可選。
Measurement Capabilities | PTS –S (175-9201) | PTS –X (175-9202) | |
Current-Voltage (IV) Testing | Measures VOC , ISC, Rshunt, Pmax, efficiency %, and fill factor | Included | Included |
Spectral Response (SR)* | Scanning range | 250 - 2500 nm | 300-5000 nm |
External Quantum Efficiency (EQE) | Incident photon to converted electron ratio (IPCE) | Included | Included |
AC and DC measurement mode | Modulated / Continuous measurement capability | Included | Included |
Internal Quantum Efficiency (IQE) | The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell | Available as an add-on | Available as an add-on |
技術規格
Configuration Description | PTS-S (175-9201) | PTS-X (175-9202) | |
Tunable Light Source | 150 W Xenon short arc lamp (1200 hour lifetime) and /or 250W QTH lamp | Xe short arc lamp | Xe +QTH lamp |
· Tuning/scanning range | 250 - 2500 nm | 300 - 5000 nm | |
· 1/4 m Czerny-Turner monochromator with an adjustable bandpass and motorized triple grating turret system (3 gratings): | 0.2-24 nm with 1200 l/mm grating @250 nm
0.2-24 nm with 1200 l/mm blaze @500 nm
0.4 - 48 nm with 600 l/mm @1000 nm | 0.4 to 48 nm with 600 l/mm blaze @ 500 nm
0.8 - 96 nm with 300l/mm blaze @ 2000 nm
1.6 - 192 nm with 150l/mm blazed @ 5400 nm | |
· Adjustable beam size | 0.5mm - 2.4 mm diameter minimum with standard optics | ||
· Hard coated order sorting filters | Included | Included | |
Bias Light Source | · 150 W or 300W Xenon short arc lamp average lifetime 1200 hours | Optional, 150W with Standard Sample Chamber, 300W with Extended Sample Chamber | |
· 25x25 or 50x50 mm AAA, (ASTM E927-19) Solar Simulator | |||
· Includes mounted AM1.5G filter + additional filter slot | |||
Reference Detector | · Broadband pyroelectric detector, Element diameter: 5 mm | Included | Included |
· Calibrated range | 250 - 2500 nm | 300-5000 nm | |
IQE Measurement System | · 50 mm integrating sphere | Optional, available as an add-on | |
· Internal quantum efficiency measurement determined from material reflectance measurement (hardware included) 250 - 2500nm range. | |||
Measurement System | · Source meter | Optional | Optional |
· Measurement time period for 100 IV points is 17s | Included | ||
· Voltage bias user settable ±10 V capability | Included | ||
· Lock-in Amplifier | Included | ||
· Chopper 4 - 200 Hz | Included | ||
· Standard auto time constant feature | Included | ||
· Temperature control (10-60 °C) * | Accessory Available | ||
· AC and DC measurement mode | Included | ||
Sample Placement | · 50 × 50 mm simple sample spacer .for proper placement of the sample under the monochromatic and bias light beam. Includes simple electrical connections. | A simple sample spacer is included, and various cell chucks are available as add-ons | |
Software and Interface | · Modern software written in .NET (Windows 11 Operating System) | Included | Included |
· Compatible with Windows 10/11, 32/64bit | Included | Included | |
· Data files and automation log exportable as ASCII | Included | Included | |
· Pre-configured and tested control computer included | Included | Included | |
· Built in microcontroller switches and monitors signals automatically | Included | Included | |
· 1 USB port | Included | Included | |
· 1 IEC 60320 C14 power entry inlet | Included | Included | |
Compliance | Intended for use in measurements according to ASTM E 1021-15, ASTM E948, IEC 60904-8, IEC 60904-1 | Included | Included |
Power system | · Single phase, configurable for 230 VAC, 50 Hz or 110 VAC, 60 Hz | Included | Included |
型號配置
| 型號 | 描述 | 光譜範圍 | 適用場景 |
|---|---|---|---|
| PTS-S (175-9201) | 標準光譜量子效率係統 | 250 - 2500 nm | 矽、鈣鈦礦、CIGS、有機光伏 |
| PTS-X (175-9202) | 擴展光譜量子效率係統 | 300 - 5000 nm | 窄禁帶半導體、紅外探測器、多結電池 |
測量能力
| 測量功能 | PTS-S | PTS-X |
|---|---|---|
| 電流-電壓 (IV) 測試 VOC、ISC、Rshunt、Pmax、效率%、填充因子 | 包含 | 包含 |
| 光譜響應 (SR) | 250-2500 nm | 300-5000 nm |
| 外部量子效率 (EQE/IPCE) | 包含 | 包含 |
| AC/DC雙測量模式 | 包含 | 包含 |
| 內部量子效率 (IQE) | 可選配件 | 可選配件 |
詳細技術規格
可調光源係統
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 光源類型 | 150W 氙氣短弧燈(可選加配250W QTH) | 氙氣短弧燈 + QTH燈組合 |
| 調諧/掃描範圍 | 250 - 2500 nm | 300 - 5000 nm |
| 單色儀 | 1/4米 Czerny-Turner,電動三光柵塔輪 | 1/4米 Czerny-Turner,電動三光柵塔輪 |
| 光柵配置 | • 1200 l/mm 閃耀250 nm (0.2-24 nm) • 1200 l/mm 閃耀500 nm (0.2-24 nm) • 600 l/mm 閃耀1000 nm (0.4-48 nm) | • 600 l/mm 閃耀500 nm (0.4-48 nm) • 300 l/mm 閃耀2000 nm (0.8-96 nm) • 150 l/mm 閃耀5400 nm (1.6-192 nm) |
| 光斑尺寸 | 0.5 - 2.4 mm直徑(標準光學配置) | 0.5 - 2.4 mm直徑(標準光學配置) |
| 級次分離濾光片 | 硬塗層,包含 | 硬塗層,包含 |
偏置光源係統
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 光源類型 | 150W 氙氣短弧燈(可選300W) | 150W 氙氣短弧燈(可選300W) |
| 太陽模擬器等級 | AAA級 (ASTM E927-19),25×25mm | AAA級 (ASTM E927-19),50×50mm(擴展樣品室) |
| 濾光片 | 標配AM1.5G + 附加濾光片插槽 | 標配AM1.5G + 附加濾光片插槽 |
參考探測器
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 類型 | 寬波段熱釋電探測器,5 mm直徑 | 寬波段熱釋電探測器,5 mm直徑 |
| 校準範圍 | 250 - 2500 nm | 300 - 5000 nm |
| 參數 | 規格 |
|---|---|
| 積分球 | 50 mm直徑 |
| 測量原理 | 通過反射率測量計算本征量子效率 |
| 光譜範圍 | PTS-S:250-2500 nm / PTS-X:300-5000 nm |
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 源表 | 可選配件 | 可選配件 |
| 100點IV測量時間 | 17秒 | 17秒 |
| 電壓偏置 | ±10 V可調 | ±10 V可調 |
| 鎖相放大器 | 包含 | 包含 |
| 斬波器 | 4 - 200 Hz | 4 - 200 Hz |
| 自動時間常數 | 包含 | 包含 |
| 溫度控製 | 可選配件 (10-60°C) | 可選配件 (10-60°C) |
| 測量模式 | AC/DC雙模式 | AC/DC雙模式 |
| 參數 | PTS-S | PTS-X |
|---|---|---|
| 樣品台 | 50×50 mm簡易樣品定位器 | 簡易樣品定位器(多種樣品夾具可選) |
| 電動XY載物台 | 可選配件 | 可選配件 |
| 參數 | 規格 |
|---|---|
| 軟件 | SciPV,.NET架構,Windows 11兼容 |
| 操作係統 | Windows 10/11 (32/64位) |
| 數據導出 | ASCII格式 |
| 控製電腦 | 預裝測試軟件,即插即用 |
| 接口 | 1×USB,1×IEC 60320 C14電源入口 |
| 自動控製 | 內置微控製器,自動切換與監控 |
| 參數 | 規格 |
|---|---|
| 符合標準 | ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1 |
| 認證 | CE |
| 電源 | 單相,可配置230VAC 50Hz / 110VAC 60Hz |
| 選項 | 說明 |
|---|---|
| IQE測量套件 | 50 mm積分球,實現內部量子效率測量 |
| 電動XY載物台 | 自動掃描,多點測量, mapping功能 |
| 多源表 | 滿足大電流/高電壓特殊需求 |
| 溫度控製 | 10 - 60℃可調,研究溫度依賴性 |
| 擴展樣品室 | 更大空間,適配特殊封裝器件 |
| 多種樣品夾具 | 針對不同電極結構定製 |
| QTH附加光源 | PTS-S可選,增強近紅外輸出 |
| 300W偏置光源 | 更高光強,適用於大麵積電池 |
PTS係列量子效率測試係統以雙光譜範圍可選、IQE靈活擴展、高精度測量、全自動軟件、個性化定製為主要優勢,為光伏、光電材料與器件研究提供完整的量子效率表征解決方案。無論您研究的是常規矽電池,還是
前沿的窄禁帶材料,PTS係列都能滿足您的測量需求。
